NWS-POL-3702 · Slurries, Compounds & Abrasives

NWS-POL-3702 Ceria Grades for STI CMP

Ceria Grades for STI CMP for oxide / nitride isolation structures. CMP. Abrasive: Cerium oxide; Typical D50: 85 nm. Custom-made for the agreed process.
Slurries, Compounds & Abrasives family reference; not the exact NWS-POL-3702 Ceria Grades for STI CMP configuration
Product-family reference. Geometry and materials are defined for the order.

HOW THIS PRODUCT IS JUDGED

Connect the physical product to its process function.

Confirm the film stack, stop layer and defect budget; chemistry differs between selectivity routes.

PRODUCT IDENTITY & CONFIGURATION

NWS-POL-3702

NewwaySmart application-selected grade · Made to order · Sample and first-article supportTypical selection data, not a universal performance guarantee. Ranges represent grade options; not every combination is available. Final dimensions or formulation and batch acceptance are agreed for the order.
Oxide / nitride isolation structuresCMP
Abrasivereference
Cerium oxide
Typical D50reference
85 nm
Typical solidsreference
Approximately 1%
Typical pHreference
Approximately 4.6
  1. 01Confirm the workpiece and process stage.
  2. 02Select the pad, plate, carrier and chemistry as a matched system.
  3. 03Agree the sample specification and acceptance method.
  4. 04Release the order specification after the agreed application trial.

SELECTION FOCUS

Questions that change the direction.

  • Oxide / nitride isolation structures
  • CMP
  • Confirm the film stack, stop layer and defect budget; chemistry differs between selectivity routes.

RFQ & DRAWING FIELDS

Evidence needed before release.

  • Workpiece material, dimensions and incoming surface
  • Machine, pad or plate, pressure, speed and liquid delivery
  • Required finish, removal allowance and inspection method
  • Quantity, sample requirement and final specification

ORDER CONFIGURATION

Made for your process.

Select the grade, custom dimensions or formulation, packaging and sample quantity. The family image illustrates the product type; the order specification defines the supplied product.Do not submit confidential customer drawings until a secure project channel is confirmed.

PUBLIC CLAIM BOUNDARY

Typical direction is not a performance guarantee.

Dimensions, materials, removal rate, roughness, life and compatibility are published only when supported by an approved drawing, material record or project-specific validation. Unverified label examples, third-party photographs and customer pricing remain internal references.

RELATED TYPES IN SLURRIES, COMPOUNDS & ABRASIVES

Compare neighbouring constructions.

Diamond slurryMonocrystalline Diamond SlurriesDiamond-slurry directions for controlled lapping and polishing where cutting action, suspension and surface target are matched.Diamond slurryPolycrystalline Diamond SlurriesPolycrystalline-diamond suspension directions for fine removal and surface refinement on compatible hard materials.Silica slurryColloidal Silica Polishing SlurriesChemistry-led silica-slurry directions for fine polishing of selected wafers, glass and ceramics.Alumina slurryAlumina Polishing SlurriesAlumina-abrasive slurry directions for selected metal, ceramic and substrate finishing steps.

DRAWING · SAMPLE · PROCESS EVIDENCE

Start with what is known. Keep assumptions visible.

Prepare the first review →